Event
Cryo-FIB Workshop
Tuesday, May 15, 2018
Kim Building, Room 1237 (AIM Lab)
Martha Heil
301 405 0876
mjheil@umd.edu
https://cryofib-umd.splashthat.com/
In collaboration with the University of Maryland, TESCAN USA, Inc. will host a workshop focused on analysis techniques of energy dispersive x-ray (EDS), electron backscattered diffraction (EBSD) on samples prepared by cryo techniques. Using the FIB and cryo transfer system, the workshop will demonstrate work with electron beam sensitive samples.
This two-day workshop is free but has limited space, so please REGISTER now!
Dr. Chiou has worked and directed several prominent electron microscopy laboratories over the last few decades. Dr. Chiou was with Northwestern University starting in the 1980s through the 1990s followed by the University of California at Irvine through the early 2000s. Dr. Chiou took over the EM laboratory at the University of Maryland in 2004 and has expanded and grow the lab since that time. He is also a Fellow of the Microscopy Society of America.
Tara received her B.S. and Masters in Chemistry from the Illinois Institute of Technology. She has worked at EDAX since 1996 in sales and applications and currently works directly with customers to solve challenging technical applications for a wide variety of prestigious universities and industries using microscopy & microanalysis. Tara oversees the EDS applications group worldwide giving presentation and demonstrations around the world.
Paul serves as one of the technology experts at Tescan-USA working with both sales and applications to support a multitude of industry segments and customers across the United States and Canada. Paul has a vast knowledge in microscopy and has a deep understanding of both electron and ion optics as well as ion solid interaction. He has spent over 30 years in microscopy and has many accomplishments including patents and publications. Paul’s education is in Electrical Engineering and is also well versed in Materials Science.
Andrew joined Leica Microsystems in 2016 and serves as an Advanced Workflow Specialist, helping customers solve their applications problems for EM sample preparation. With a background in Materials Science and Engineering, Andrew specializes in imaging and elemental analysis applications for materials science, semiconductor, and polymeric materials research. Prior to joining Leica, Andrew completed an M.S. degree in Materials Science and Engineering at the University of Maryland where he focused on nanofabrication, imaging, and characterization of plasmonic materials. Andrew is also currently working to expand his knowledge of life science applications for electron microscopy.
